[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - FIT numerical modeling for EMI Discovery and #x201C;Design#x201D;

• 作者Drewniak, J.
• 文件大小1555.37KB
• 发表时间2008
• DOI10.1109/isemc.2008.4652229
• 页码1-11