[IEEE 2008 IEEE Symposium on Visual Analytics Science and Technology (VAST) - Columbus, OH, USA (2008.10.19-2008.10.24)] 2008 IEEE Symposium on Visual Analytics Science and Technology - Understanding syndromic hotspots - a visual analytics approach
Maciejewski, Ross; Rudolph, Stephen; Hafen, Ryan; Abusalah, Ahmad; Yakout, Mohamed; Ouzzani, Mourad; Cleveland, William S.; Grannis, Shaun J.; Wade, Michael; Ebert, David S.
- 作者Maciejewski, Ross; Rudolph, Stephen; Hafen, Ryan; Abusalah, Ahmad; Yakout, Mohamed; Ouzzani, Mourad; Cleveland, William S.; Grannis, Shaun J.; Wade, Michael; Ebert, David S.
- 文件大小2206.58KB
- 发表时间2008
- DOI10.1109/vast.2008.4677354
- 页码35-42