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[IEEE 2008 IEEE Symposium on Visual Analytics Science and Technology (VAST) - Columbus, OH, USA (2008.10.19-2008.10.24)] 2008 IEEE Symposium on Visual Analytics Science and Technology - Understanding syndromic hotspots - a visual analytics approach

[IEEE 2008 IEEE Symposium on Visual Analytics Science and Technology (VAST) - Columbus, OH, USA (2008.10.19-2008.10.24)] 2008 IEEE Symposium on Visual Analytics Science and Technology - Understanding syndromic hotspots - a visual analytics approach

Maciejewski, Ross; Rudolph, Stephen; Hafen, Ryan; Abusalah, Ahmad; Yakout, Mohamed; Ouzzani, Mourad; Cleveland, William S.; Grannis, Shaun J.; Wade, Michael; Ebert, David S.
  • 作者Maciejewski, Ross; Rudolph, Stephen; Hafen, Ryan; Abusalah, Ahmad; Yakout, Mohamed; Ouzzani, Mourad; Cleveland, William S.; Grannis, Shaun J.; Wade, Michael; Ebert, David S.
  • 文件大小2206.58KB
  • 发表时间2008
  • DOI10.1109/vast.2008.4677354
  • 页码35-42
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