[IEEE 2008 26th International Conference on Microelectronics (MIEL 2008) - Nis, Serbia and Montenegro (2008.05.11-2008.05.14)] 2008 26th International Conference on Microelectronics - New approach in estimating the lifetime in NBT stressed P-channel power VDMOSFETs
- 作者Dankovic, D.; Manic, I.; Davidovic, V.; Djoric-Veljkovic, S.; Golubovic, S.; Stojadinovic, N.
- 文件大小584.01KB
- 发表时间2008
- DOI10.1109/icmel.2008.4559357
- 页码599-602
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