[IEEE 2008 Annual Reliability and Maintainability Symposium - Las Vegas, NV, USA (2008.01.28-2008.01.31)] 2008 Annual Reliability and Maintainability Symposium - An integrated maintenance management information system is the key to enabling condition based maintenance
Sautter, F. Chris; Jemison, Patrick W.; Goes, Christopher M.; Wooten, Jerod M.
- 作者Sautter, F. Chris; Jemison, Patrick W.; Goes, Christopher M.; Wooten, Jerod M.
- 文件大小1106.54KB
- 发表时间2008
- DOI10.1109/rams.2008.4925848
- 页码508-513