Emissivity-corrected power loss calibration for lock-in thermography measurements on silicon solar cells
Kasemann, Martin; Walter, Benjamin; Meinhardt, Christoph; Ebser, Jan; Kwapil, Wolfram; Warta, Wilhelm
- 期刊名称Journal of Applied Physics
- 作者Kasemann, Martin; Walter, Benjamin; Meinhardt, Christoph; Ebser, Jan; Kwapil, Wolfram; Warta, Wilhelm
- 卷第103卷
- 期第11期
- 印刷ISSN0021-8979
- 文件大小869.30KB
- 发表时间2008
- DOI10.1063/1.2930880