Evolution of CuSn intermetallics between molten SnAgCu solder and Cu substrate
Jicheng Gong; Changqing Liu; Paul P. Conway; Vadim V. Silberschmidt
- 作者Jicheng Gong; Changqing Liu; Paul P. Conway; Vadim V. Silberschmidt
- 卷第56卷
- 期第16期
- 印刷ISSN1359-6454
- 文件大小1528.09KB
- 发表时间2008
- DOI10.1016/j.actamat.2008.04.063
- 页码4291-4297