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[IEEE 2008 7th World Congress on Intelligent Control and Automation - Chongqing, China (2008.06.25-2008.06.27)] 2008 7th World Congress on Intelligent Control and Automation - Fault diagnosis approach based on probabilistic neural network and wavelet analysis

[IEEE 2008 7th World Congress on Intelligent Control and Automation - Chongqing, China (2008.06.25-2008.06.27)] 2008 7th World Congress on Intelligent Control and Automation - Fault diagnosis approach based on probabilistic neural network and wavelet analysis

Qing Yang, ; Lei Gu, ; Dazhi Wang, ; Dongsheng Wu,

作者Qing Yang, ; Lei Gu, ; Dazhi Wang, ; Dongsheng Wu,
文件大小238.01KB
发表时间2008
DOI10.1109/wcica.2008.4593194
页码1796-1799

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