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[IEEE 2008 8th IEEE Conference on Nanotechnology (NANO) - Arlington, Texas, USA (2008.08.18-2008.08.21)] 2008 8th IEEE Conference on Nanotechnology - Error-Model Driven Analysis of Quantum Circuits Reliability

[IEEE 2008 8th IEEE Conference on Nanotechnology (NANO) - Arlington, Texas, USA (2008.08.18-2008.08.21)] 2008 8th IEEE Conference on Nanotechnology - Error-Model Driven Analysis of Quantum Circuits Reliability

Boncalo, Oana; Udrescu, Mihai; Prodan, Lucian; Vladutiu, Mircea; Amaricai, Alexandru
  • 作者Boncalo, Oana; Udrescu, Mihai; Prodan, Lucian; Vladutiu, Mircea; Amaricai, Alexandru
  • 文件大小352.58KB
  • 发表时间2008
  • DOI10.1109/nano.2008.187
  • 页码625-628
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