[IEEE Telecommunication Technology" (CriMiCo 2008) - Sevastopol, Ukraine (2008.09.8-2008.09.12)] 2008 18th International Crimean Conference - Microwave & Telecommunication Technology - On the possibilities of automatic measurements of microwave parameters of MMIC on wafer in Istok
Galdetskiy, A. V.; Buvailyk, E. V.; Vasiliev, V. I.; Korolev, A. N.
- 作者Galdetskiy, A. V.; Buvailyk, E. V.; Vasiliev, V. I.; Korolev, A. N.
- 文件大小1162.83KB
- 发表时间2008
- DOI10.1109/crmico.2008.4676571
- 页码719-719