发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 21st International Conference on VLSI Design (VLSID 2008) - Hyderabad, India (2008.01.4-2008.01.8)] 21st International Conference on VLSI Design (VLSID 2008) - Temperature and Process Variations Aware Power Gating of Functional Units

Kannan, Deepa; Shrivastava, Aviral; Mohan, Vipin; Bhardwaj, Sarvesh; Vrudhula, Sarma

作者Kannan, Deepa; Shrivastava, Aviral; Mohan, Vipin; Bhardwaj, Sarvesh; Vrudhula, Sarma
文件大小1375.44KB
发表时间2008
DOI10.1109/vlsi.2008.83
页码515-520