[IEEE 2008 IEEE/LEOS Internationall Conference on Optical MEMs and Nanophotonics - Freiburg, Germany (2008.08.11-2008.08.14)] 2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics - Near-field scanning nanophotonic microscopy
Zhang, John X.J.; Hoshino, Kazunori; Gopal, Ashwini
- 作者Zhang, John X.J.; Hoshino, Kazunori; Gopal, Ashwini
- 文件大小465.55KB
- 发表时间2008
- DOI10.1109/omems.2008.4607888
- 页码180-181