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Stacking faults in homoepitaxy on Ir(111): Detection, evolution with film thickness, and associated defect patterns

Stacking faults in homoepitaxy on Ir(111): Detection, evolution with film thickness, and associated defect patterns

Bleikamp, Sebastian; Thoma, Arne; Polop, Celia; Michely, Thomas

期刊名称Physical Review B
作者Bleikamp, Sebastian; Thoma, Arne; Polop, Celia; Michely, Thomas
卷第77卷
期第24期
印刷ISSN1098-0121
电子ISSN1550-235X
文件大小2994.03KB
发表时间2008-6-18
DOI10.1103/physrevb.77.245424

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