[IEEE 2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) - Bratislava, Slovakia (2008.04.16-2008.04.18)] 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems - Deep-Submicron MOS Transistor Matching: A Case Study
- 作者Dimitrov, Dimitar P.
- 文件大小589.77KB
- 发表时间2008
- DOI10.1109/ddecs.2008.4538744
- 页码1-4
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