[IEEE 2008 International Conference on Signals and Electronic Systems - Krakow, Poland (2008.09.14-2008.09.17)] 2008 International Conference on Signals and Electronic Systems - The use of variable load for RF circuit testing
- 作者Kyziol, Piotr; Grzechca, Damian; Golonek, Tomasz; Rutkowski, Jerzy
- 文件大小110.37KB
- 发表时间2008
- DOI10.1109/icses.2008.4673496
- 页码557-560
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