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[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Excellent resistive switching characteristics of Cu doped ZrO<inf>2</inf> and its 64 bit cross-point integration

[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Excellent resistive switching characteristics of Cu doped ZrO2 and its 64 bit cross-point integration

Ming Liu, ; Guan, Weihua; Shibing Long, ; Qi Liu, ; Wei Wang,
  • 作者Ming Liu, ; Guan, Weihua; Shibing Long, ; Qi Liu, ; Wei Wang,
  • 文件大小3820.49KB
  • 发表时间2008
  • DOI10.1109/icsict.2008.4734692
  • 页码905-908
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