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[IEEE 2008 International Conference on Embedded Software and Systems - Chengdu, SiChuan, China (2008.07.29-2008.07.31)] 2008 International Conference on Embedded Software and Systems - An Embedded System for Borescope and Eddy Current Dual Nondestructive Testing Based on ARM Microcontroller

[IEEE 2008 International Conference on Embedded Software and Systems - Chengdu, SiChuan, China (2008.07.29-2008.07.31)] 2008 International Conference on Embedded Software and Systems - An Embedded System for Borescope and Eddy Current Dual Nondestructive Testing Based on ARM Microcontroller

Wugang, Tian; Mengchun, Pan; Feilu, Luo; Jianbin, Su; Dixiang, Chen

作者Wugang, Tian; Mengchun, Pan; Feilu, Luo; Jianbin, Su; Dixiang, Chen
文件大小497.56KB
发表时间2008
DOI10.1109/ICESS.2008.53
页码237-242

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