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Quantitative Evaluation of Gettering Efficiencies Below 1×10[sup 12] Atoms∕cm[sup 3] in p-Type Silicon Using a [sup 65]Cu Tracer

Quantitative Evaluation of Gettering Efficiencies Below 1×10[sup 12] Atoms∕cm[sup 3] in p-Type Silicon Using a [sup 65]Cu Tracer

Kim, Kwang-Salk; Lee, Sung-Wook; Kang, Hee-Bok; Lee, Bo-Young; Park, Su-Moon
  • 期刊名称Journal of The Electrochemical Society
  • 作者Kim, Kwang-Salk; Lee, Sung-Wook; Kang, Hee-Bok; Lee, Bo-Young; Park, Su-Moon
  • 卷第155卷
  • 期第11期
  • 印刷ISSN0013-4651
  • 文件大小493.00KB
  • 发表时间2008
  • DOI10.1149/1.2977724
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