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[ACM Press the Second ACM-IEEE international symposium - Kaiserslautern, Germany (2008.10.09-2008.10.10)] Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement - ESEM '08 - Defect categorization

[ACM Press the Second ACM-IEEE international symposium - Kaiserslautern, Germany (2008.10.09-2008.10.10)] Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement - ESEM '08 - Defect categorization

Seaman, Carolyn B.; Shull, Forrest; Regardie, Myrna; Elbert, Denis; Feldmann, Raimund L.; Guo, Yuepu; Godfrey, Sally
  • 作者Seaman, Carolyn B.; Shull, Forrest; Regardie, Myrna; Elbert, Denis; Feldmann, Raimund L.; Guo, Yuepu; Godfrey, Sally
  • 文件大小468.99KB
  • 发表时间2008
  • DOI10.1145/1414004.1414030
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