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[ACM Press Proceeding of the thirteenth international symposium - Bangalore, India (2008.08.11-2008.08.13)] Proceeding of the thirteenth international symposium on Low power electronics and design - ISLPED '08 - Reliability-centric gate sizing with simultaneous optimization of soft error rate, delay and power

[ACM Press Proceeding of the thirteenth international symposium - Bangalore, India (2008.08.11-2008.08.13)] Proceeding of the thirteenth international symposium on Low power electronics and design - ISLPED '08 - Reliability-centric gate sizing with simultaneous optimization of soft error rate, delay and power

Bhattacharya, Koustav; Ranganathan, Nagarajan

作者Bhattacharya, Koustav; Ranganathan, Nagarajan
文件大小479.84KB
发表时间2008
DOI10.1145/1393921.1393948

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