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[IEEE 2008 IEEE International Symposium on Knowledge Acquisition and Modeling Workshop (KAM 2008 Workshop) - Wuhan, China (2008.12.21-2008.12.22)] 2008 IEEE International Symposium on Knowledge Acquisition and Modeling Workshop - Statistical Process Control Based on Multi-scale Wavelets Analysis

[IEEE 2008 IEEE International Symposium on Knowledge Acquisition and Modeling Workshop (KAM 2008 Workshop) - Wuhan, China (2008.12.21-2008.12.22)] 2008 IEEE International Symposium on Knowledge Acquisition and Modeling Workshop - Statistical Process Control Based on Multi-scale Wavelets Analysis

Rong-zhen, Shi; Fei, Liu

作者Rong-zhen, Shi; Fei, Liu
文件大小88.94KB
发表时间2008
DOI10.1109/kamw.2008.4810443
页码136-138

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