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[IEEE 2008 IEEE Second International Conference on Biometrics: Theory, Applications and Systems - Washington, DC, USA (2008.09.29-2008.10.1)] 2008 IEEE Second International Conference on Biometrics: Theory, Applications and Systems - Committee

[IEEE 2008 IEEE Second International Conference on Biometrics: Theory, Applications and Systems - Washington, DC, USA (2008.09.29-2008.10.1)] 2008 IEEE Second International Conference on Biometrics: Theory, Applications and Systems - Committee

  • 文件大小506.33KB
  • 发表时间2008
  • DOI10.1109/btas.2008.4699316
  • 页码1-2
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