![[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction]()
[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Modeling Interconnect Variability Using Efficient Parametric Model Order ReductionPeng Li, ; Liu, F.; Xin Li, ; Pileggi, L.T.; Nassif, S.R. · 2005