SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Front Matter: Volume 7282
- 作者SPIE, Proceedings of; Yang, Li; Schoen, John M.; Namba, Yoshiharu; Li, Shengyi
- 卷第7282卷
- 印刷ISSN0277-786X
- 文件大小257.59KB
- 发表时间2008
- DOI10.1117/12.834721
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