[IEEE 2008 Fifth International Conference on Fuzzy Systems and Knowledge Discovery (FSKD) - Jinan Shandong, China (2008.10.18-2008.10.20)] 2008 Fifth International Conference on Fuzzy Systems and Knowledge Discovery - Dynamic Testing Algorithm Based on Rough Sets for Multiple Fault Diagnosis

• 作者Gao, Lei; Zeng, Guangzhou
• 文件大小271.82KB
• 发表时间2008
• DOI10.1109/fskd.2008.176
• 页码157-163