[ASME ASME 2008 International Manufacturing Science and Engineering Conference collocated with the 3rd JSME/ASME International Conference on Materials and Processing - Evanston, Illinois, USA (October 7–10, 2008)] ASME 2008 International Manufacturing Science and Engineering Conference, Volume 1 - Characteristics of Residual Stress Profiles in Hard Turned Versus Ground Surfaces With and Without a White Layer
- 作者Warren, A. W.; Guo, Y. B.
- 文件大小648.23KB
- 发表时间2008
- DOI10.1115/msec_icmp2008-72230
- 页码387-396
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