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Applicant and Examiner Citations in US Patents: An Overview and Analysis

Applicant and Examiner Citations in US Patents: An Overview and Analysis

Alcacer, Juan; Gittelman, Michelle; Sampat, Bhaven N.
  • 期刊名称SSRN Electronic Journal
  • 作者Alcacer, Juan; Gittelman, Michelle; Sampat, Bhaven N.
  • 电子ISSN1556-5068
  • 文件大小354.07KB
  • 发表时间2008
  • DOI10.2139/ssrn.1273016
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