Applicant and Examiner Citations in US Patents: An Overview and Analysis
Alcacer, Juan; Gittelman, Michelle; Sampat, Bhaven N.
- 期刊名称SSRN Electronic Journal
- 作者Alcacer, Juan; Gittelman, Michelle; Sampat, Bhaven N.
- 电子ISSN1556-5068
- 文件大小354.07KB
- 发表时间2008
- DOI10.2139/ssrn.1273016