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[ASME 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems - Clear Water Bay, Kowloon, Hong Kong (Tuesday 3 June 2008)] 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems - Nanoindentation Characterization of Ultrafine-Grained Surface Layer by Turning Versus Grinding

[ASME 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems - Clear Water Bay, Kowloon, Hong Kong (Tuesday 3 June 2008)] 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems - Nanoindentation Characterization of Ultrafine-Grained Surface Layer by Turning Versus Grinding

Warren, A. W.; Guo, Y. B.
  • 作者Warren, A. W.; Guo, Y. B.
  • 文件大小625.92KB
  • 发表时间2008
  • DOI10.1115/MicroNano2008-70152
  • 页码251-256
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