Improving Yield and Defect Tolerance in Subthreshold CMOS Through Output-Wired Redundancy
- 作者Kristian Granhaug; Snorre Aunet
- 卷第24卷
- 印刷ISSN0923-8174
- 电子ISSN1573-0727
- 文件大小300.50KB
- 发表时间2008-06
- DOI10.1007/s10836-007-5027-1
- 页码157-163
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