发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

Applicant and examiner citations in U.S. patents: An overview and analysis

Applicant and examiner citations in U.S. patents: An overview and analysis

Juan Alcácer; Michelle Gittelman; Bhaven Sampat

作者Juan Alcácer; Michelle Gittelman; Bhaven Sampat
卷第38卷
期第2期
印刷ISSN0048-7333
文件大小450.78KB
发表时间2009
DOI10.1016/j.respol.2008.12.001

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