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Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure

Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure

Nowozin, T.; Marent, A.; Geller, M.; Bimberg, D.; Akçay, N.; Öncan, N.
  • 期刊名称Applied Physics Letters
  • 作者Nowozin, T.; Marent, A.; Geller, M.; Bimberg, D.; Akçay, N.; Öncan, N.
  • 卷第94卷
  • 期第4期
  • 印刷ISSN0003-6951
  • 文件大小376.16KB
  • 发表时间2009
  • DOI10.1063/1.3076126
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