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[IEEE 2009 Proceedings of the European Solid State Device Research Conference (ESSDERC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of the European Solid State Device Research Conference - Robustness to gate imperfections of the tunneling enhancement effect in double quantum dots

[IEEE 2009 Proceedings of the European Solid State Device Research Conference (ESSDERC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of the European Solid State Device Research Conference - Robustness to gate imperfections of the tunneling enhancement effect in double quantum dots

Totaro, Massimo; Logoteta, Demetrio; Marconcini, Paolo; Macucci, Massimo; Whitney, Robert S.

作者Totaro, Massimo; Logoteta, Demetrio; Marconcini, Paolo; Macucci, Massimo; Whitney, Robert S.
文件大小965.72KB
发表时间2009
DOI10.1109/essderc.2009.5331314
页码464-467

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