[IEEE 2009 3rd IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications (MAPE) - Beijing, China (2009.10.27-2009.10.29)] 2009 3rd IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications - The design of a multifunctional test apparatus-LISN Used for conduction interference testing
Yue, Lingling; Zhang, Xiaodong
- 作者Yue, Lingling; Zhang, Xiaodong
- 文件大小158.40KB
- 发表时间2009
- DOI10.1109/mape.2009.5355760
- 页码862-864