发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing

Fujibe, T.; Suda, M.; Yamamoto, K.; Nagata, Y.; Fujita, K.; Watanabe, D.; Okayasu, T.

作者Fujibe, T.; Suda, M.; Yamamoto, K.; Nagata, Y.; Fujita, K.; Watanabe, D.; Okayasu, T.
文件大小858.67KB
发表时间2009
DOI10.1109/test.2009.5355735
页码1-10