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[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability of high power QCW cm-bar arrays

[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability of high power QCW cm-bar arrays

Lu Guoguang, ; Huang Yun, ; En Yunfei, ; Yang Shaohua, ; Lei Zhifeng,
  • 作者Lu Guoguang, ; Huang Yun, ; En Yunfei, ; Yang Shaohua, ; Lei Zhifeng,
  • 文件大小5835.73KB
  • 发表时间2009
  • DOI10.1109/ipfa.2009.5232648
  • 页码298-301
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