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[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability problems investigation during the pLEDMOS fabrication

[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability problems investigation during the pLEDMOS fabrication

Qinsong Qian, ; Hong Wu, ; Siyang Liu, ; Weifeng Sun, ; Longxing Shi,
  • 作者Qinsong Qian, ; Hong Wu, ; Siyang Liu, ; Weifeng Sun, ; Longxing Shi,
  • 文件大小4197.67KB
  • 发表时间2009
  • DOI10.1109/ipfa.2009.5232616
  • 页码430-433
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