Contact resistance in carbon nanostructure via interconnects
Wu, Wen; Krishnan, Shoba; Yamada, Toshishige; Sun, Xuhui; Wilhite, Patrick; Wu, Raymond; Li, Ke; Yang, Cary Y.
- 期刊名称Applied Physics Letters
- 作者Wu, Wen; Krishnan, Shoba; Yamada, Toshishige; Sun, Xuhui; Wilhite, Patrick; Wu, Raymond; Li, Ke; Yang, Cary Y.
- 卷第94卷
- 期第16期
- 印刷ISSN0003-6951
- 文件大小429.20KB
- 发表时间2009
- DOI10.1063/1.3123164