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[IEEE 2009 IEEE International Symposium on Circuits and Systems - ISCAS 2009 - Taipei, Taiwan (2009.05.24-2009.05.27)] 2009 IEEE International Symposium on Circuits and Systems - Efficient test circuit to qualify logic cells

[IEEE 2009 IEEE International Symposium on Circuits and Systems - ISCAS 2009 - Taipei, Taiwan (2009.05.24-2009.05.27)] 2009 IEEE International Symposium on Circuits and Systems - Efficient test circuit to qualify logic cells

Ribas, R. P.; Bavaresco, S.; Lubaszewski, M.; Reis, A. I.

作者Ribas, R. P.; Bavaresco, S.; Lubaszewski, M.; Reis, A. I.
文件大小694.54KB
发表时间2009
DOI10.1109/iscas.2009.5118367
页码2733-2736

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