[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Exploiting Unused Spare Columns to Improve Memory ECC
- 作者Datta, Rudrajit; Touba, Nur A.
- 文件大小676.84KB
- 发表时间2009
- DOI10.1109/vts.2009.52
- 页码47-52
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