Comment on “Half-metallicity in europium oxide conductively matched with silicon”
Schmehl, Andreas; Vaithyanathan, Venu; Herrnberger, Alexander; Thiel, Stefan; Richter, Christoph; Heeg, Tassilo; Röckerath, Martin; Kourkoutis, Lena Fitting; Mühlbauer, Sebastian; Böni, Peter; Muller, David A.; Barash, Yuri; Schubert, Jürgen; Mannhart, Jochen; Schlom, Darrell G.
- 期刊名称Physical Review B
- 作者Schmehl, Andreas; Vaithyanathan, Venu; Herrnberger, Alexander; Thiel, Stefan; Richter, Christoph; Heeg, Tassilo; Röckerath, Martin; Kourkoutis, Lena Fitting; Mühlbauer, Sebastian; Böni, Peter; Muller, David A.; Barash, Yuri; Schubert, Jürgen; Mannhart, Jochen; Schlom, Darrell G.
- 卷第80卷
- 期第23期
- 印刷ISSN1098-0121
- 电子ISSN1550-235X
- 文件大小40.08KB
- 发表时间2009-12-11
- DOI10.1103/physrevb.80.237301