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[IEEE 2009 American Control Conference - St. Louis, MO, USA (2009.06.10-2009.06.12)] 2009 American Control Conference - High-speed high-precision control of atomic force microscope by surface topography learning observer

[IEEE 2009 American Control Conference - St. Louis, MO, USA (2009.06.10-2009.06.12)] 2009 American Control Conference - High-speed high-precision control of atomic force microscope by surface topography learning observer

Shiraishi, Takayuki; Fujimoto, Hiroshi

作者Shiraishi, Takayuki; Fujimoto, Hiroshi
文件大小1122.12KB
发表时间2009
DOI10.1109/acc.2009.5160749
页码961-966

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