[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - The relationship between LED package and reliability
Lu Guoguang, ; Huang Yun, ; En Yunfei, ; Yang Shaohua, ; Lei Zhifeng,
- 作者Lu Guoguang, ; Huang Yun, ; En Yunfei, ; Yang Shaohua, ; Lei Zhifeng,
- 文件大小6143.86KB
- 发表时间2009
- DOI10.1109/ipfa.2009.5232642
- 页码323-326