[IEEE 2009 IEEE 8th International Conference on ASIC (ASICON) - Changsha, Hunan, China (2009.10.20-2009.10.23)] 2009 IEEE 8th International Conference on ASIC - Automatic configuration generation for a SOC co-verification technology based FPGA functional test system
Ruan, A.W.; Liao, Y.B.; Li, P.; Li, W.; Li, W.C.
- 作者Ruan, A.W.; Liao, Y.B.; Li, P.; Li, W.; Li, W.C.
- 文件大小5129.16KB
- 发表时间2009
- DOI10.1109/asicon.2009.5351358
- 页码605-608