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GaAs HEMT Reliability and Degradation Mechanisms after Long Term Stress Testing

GaAs HEMT Reliability and Degradation Mechanisms after Long Term Stress Testing

Douglas, Erica Ann; Cheney, David P.; Chen, Ke Hung P.; Chang, Chih-Yang P.; Leu, Lii-Cherng P.; Gila, Brent P.; Abernathy, Cammy R.; Pearton, Stephen J.
  • 期刊名称MRS Proceedings
  • 作者Douglas, Erica Ann; Cheney, David P.; Chen, Ke Hung P.; Chang, Chih-Yang P.; Leu, Lii-Cherng P.; Gila, Brent P.; Abernathy, Cammy R.; Pearton, Stephen J.
  • 卷第1195卷
  • 电子ISSN1946-4274
  • 文件大小291.08KB
  • 发表时间2009-1
  • DOI10.1557/PROC-1195-B05-04
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