SPIE Proceedings [SPIE SPIE Europe Optics + Optoelectronics - Prague, Czech Republic (Monday 20 April 2009)] Metamaterials IV - A genetic algorithm based procedure to retrieve effective parameters of planar metamaterial samples
- 作者Tricarico, Simone; Bilotti, Filiberto; Vegni, Lucio; Kuzmiak, Vladimir; Markos, Peter; Szoplik, Tomasz
- 卷第7353卷
- 印刷ISSN0277-786X
- 文件大小426.01KB
- 发表时间2009
- DOI10.1117/12.820648