SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Study of the measurement of solution concentration by surface plasmon resonance heterodyne interferometer

Chen, Kun-Huang; Lehmann, Peter H.; Chen, Jing-Heng; Lin, Jiun-You; Chang, Wei-Yao; Hsieh, Hsiang-Yung

作者Chen, Kun-Huang; Lehmann, Peter H.; Chen, Jing-Heng; Lin, Jiun-You; Chang, Wei-Yao; Hsieh, Hsiang-Yung
卷第7389卷
印刷ISSN0277-786X
文件大小270.46KB
发表时间2009
DOI10.1117/12.826857

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