[ACM Press the 2nd International Workshop - Chicago, Illinois (2009.07.19-2009.07.19)] Proceedings of the 2nd International Workshop on Defects in Large Software Systems Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009) - DEFECTS '09 - Techniques for software quality analysis of binaries

• 作者Panas, Thomas; Quinlan, Daniel
• 文件大小750.47KB
• 发表时间2009
• DOI10.1145/1555860.1555863