Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope
Rouvimov, S; Moeck, P; Nicolopoulos, S
- 期刊名称Microscopy and Microanalysis
- 作者Rouvimov, S; Moeck, P; Nicolopoulos, S
- 卷第15卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小494.17KB
- 发表时间2009-7
- DOI10.1017/s1431927609096482
- 页码1230-1231