High Throughput Automated Crystal Orientation and Phase Mapping of Nanoparticles from HREM - TEM Images
- 期刊名称Microscopy and Microanalysis
- 作者Rauch, EF; Rouvimov, S; Nicolopoulos, S; Moeck, P
- 卷第15卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小671.51KB
- 发表时间2009-7
- DOI10.1017/s1431927609099607
- 页码756-757
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