Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
- 期刊名称Microscopy and Microanalysis
- 作者Wang, P; Behan, G; Kirkland, AI; Nellist, P
- 卷第15卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小356.53KB
- 发表时间2009-7
- DOI10.1017/s1431927609094069
- 页码42-43
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