[IEEE 2009 WRI World Congress on Computer Science and Information Engineering - Los Angeles, California USA (2009.03.31-2009.04.2)] 2009 WRI World Congress on Computer Science and Information Engineering - A Novel Sequential Testing Algorithm Based on Rough-Compact Sets Theory for Multiple Fault Diagnosis
- 作者Lei, Gao; Guangzhou, Zeng
- 文件大小360.08KB
- 发表时间2009
- DOI10.1109/csie.2009.42
- 页码17-23
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